Daily Archives: 2017-05-03

Commissioning of IR detector at JHU

PFS is a spectrometer that disperses light and measures the intensity as a function of wavelength using photosensitive detectors. The operational bandpass for the PFS instrument covers the wavelengths from 380nm to 1260nm. The light delivered to the spectrograph is initially separated into three channels of blue, red, and near-infrared (NIR) by two dichroic mirrors. Each channel is deflected to… Read more »